Evaluation of mirror full adder circuit reliability performance due to negative bias temperature instability (NBTI) effects based on different defect mechanisms
Negative bias temperature instability (NBTI) is an aging effect that can cause the threshold voltage to be shifted hence reduce the drain current. This will subsequently leads to main aging effect in sub-micron CMOS circuits. The NBTI defect mechanisms consist of interface trap generation and hole t...
| 發表在: | AIP Conference Proceedings |
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| 主要作者: | |
| 格式: | Conference paper |
| 語言: | English |
| 出版: |
American Institute of Physics Inc.
2017
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| 在線閱讀: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85030723806&doi=10.1063%2f1.5002427&partnerID=40&md5=db052226200fd05ddcd840d2b81733f2 |