Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
The recent research work focuses on the realization of ITO/ZnO/Ag-based multifunctional devices. The fabricated devices exhibits multi-task operations, including ultraviolet (UV) light detection and non-volatile resistive switching (RS) memory applications. The intermediate ZnO switching layers were...
出版年: | ENGINEERING RESEARCH EXPRESS |
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主要な著者: | , , , , , , |
フォーマット: | 論文 |
言語: | English |
出版事項: |
IOP Publishing Ltd
2025
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主題: | |
オンライン・アクセス: | https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001446987900001 |
author |
Kossar Shahnaz; Rasool Asif; Amiruddin R.; Ismail Ahmad Syakirin; Mamat M. H.; Sharma Jyoti |
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spellingShingle |
Kossar Shahnaz; Rasool Asif; Amiruddin R.; Ismail Ahmad Syakirin; Mamat M. H.; Sharma Jyoti Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications Engineering |
author_facet |
Kossar Shahnaz; Rasool Asif; Amiruddin R.; Ismail Ahmad Syakirin; Mamat M. H.; Sharma Jyoti |
author_sort |
Kossar |
spelling |
Kossar, Shahnaz; Rasool, Asif; Amiruddin, R.; Ismail, Ahmad Syakirin; Mamat, M. H.; Sharma, Jyoti Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications ENGINEERING RESEARCH EXPRESS English Article The recent research work focuses on the realization of ITO/ZnO/Ag-based multifunctional devices. The fabricated devices exhibits multi-task operations, including ultraviolet (UV) light detection and non-volatile resistive switching (RS) memory applications. The intermediate ZnO switching layers were deposited using the spin-coating technique at 2500 rpm. The structural analysis validates the presence of wurtzite structure along the c-axis. The morphological analysis reveals that the grains are uniformly distributed of the deposited thin films. The PL emission spectrum of the ZnO thin film shows highly intensive peak at 382 nm. The obtained ZnO thin film was formed onto ITO substrate which was sandwiched between top and bottom Ag electrodes. The current-voltage measurements (I-V) and ln I-V plots characteristics of the fabricated ITO/ZnO/Ag devices were examined for UV photoresponse (under dark and UV illumination), and resistive switching (RS) behavior. The fabricated device shows a stable resistive switching characteristics and UV photoresponse with photoresponsivity (R) value of 0.52 mA W-1. The fabricated ITO/ZnO/Ag devices shows rise time 4.35 s and 9.25 s decay time respectively. The optical sensing mechanism of ITO/ZnO/Ag were explored by oxygen (O-2) adsorption/desorption processes in Ag/ZnO and ITO/ZnO junctions across the interface. IOP Publishing Ltd 2631-8695 2025 7 1 10.1088/2631-8695/adbcfa Engineering WOS:001446987900001 https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001446987900001 |
title |
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications |
title_short |
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications |
title_full |
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications |
title_fullStr |
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications |
title_full_unstemmed |
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications |
title_sort |
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications |
container_title |
ENGINEERING RESEARCH EXPRESS |
language |
English |
format |
Article |
description |
The recent research work focuses on the realization of ITO/ZnO/Ag-based multifunctional devices. The fabricated devices exhibits multi-task operations, including ultraviolet (UV) light detection and non-volatile resistive switching (RS) memory applications. The intermediate ZnO switching layers were deposited using the spin-coating technique at 2500 rpm. The structural analysis validates the presence of wurtzite structure along the c-axis. The morphological analysis reveals that the grains are uniformly distributed of the deposited thin films. The PL emission spectrum of the ZnO thin film shows highly intensive peak at 382 nm. The obtained ZnO thin film was formed onto ITO substrate which was sandwiched between top and bottom Ag electrodes. The current-voltage measurements (I-V) and ln I-V plots characteristics of the fabricated ITO/ZnO/Ag devices were examined for UV photoresponse (under dark and UV illumination), and resistive switching (RS) behavior. The fabricated device shows a stable resistive switching characteristics and UV photoresponse with photoresponsivity (R) value of 0.52 mA W-1. The fabricated ITO/ZnO/Ag devices shows rise time 4.35 s and 9.25 s decay time respectively. The optical sensing mechanism of ITO/ZnO/Ag were explored by oxygen (O-2) adsorption/desorption processes in Ag/ZnO and ITO/ZnO junctions across the interface. |
publisher |
IOP Publishing Ltd |
issn |
2631-8695 |
publishDate |
2025 |
container_volume |
7 |
container_issue |
1 |
doi_str_mv |
10.1088/2631-8695/adbcfa |
topic |
Engineering |
topic_facet |
Engineering |
accesstype |
|
id |
WOS:001446987900001 |
url |
https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001446987900001 |
record_format |
wos |
collection |
Web of Science (WoS) |
_version_ |
1828987785410772992 |