Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications

The recent research work focuses on the realization of ITO/ZnO/Ag-based multifunctional devices. The fabricated devices exhibits multi-task operations, including ultraviolet (UV) light detection and non-volatile resistive switching (RS) memory applications. The intermediate ZnO switching layers were...

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書誌詳細
出版年:ENGINEERING RESEARCH EXPRESS
主要な著者: Kossar, Shahnaz; Rasool, Asif; Amiruddin, R.; Ismail, Ahmad Syakirin; Mamat, M. H.; Sharma, Jyoti
フォーマット: 論文
言語:English
出版事項: IOP Publishing Ltd 2025
主題:
オンライン・アクセス:https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001446987900001
author Kossar
Shahnaz; Rasool
Asif; Amiruddin
R.; Ismail
Ahmad Syakirin; Mamat
M. H.; Sharma
Jyoti
spellingShingle Kossar
Shahnaz; Rasool
Asif; Amiruddin
R.; Ismail
Ahmad Syakirin; Mamat
M. H.; Sharma
Jyoti
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
Engineering
author_facet Kossar
Shahnaz; Rasool
Asif; Amiruddin
R.; Ismail
Ahmad Syakirin; Mamat
M. H.; Sharma
Jyoti
author_sort Kossar
spelling Kossar, Shahnaz; Rasool, Asif; Amiruddin, R.; Ismail, Ahmad Syakirin; Mamat, M. H.; Sharma, Jyoti
Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
ENGINEERING RESEARCH EXPRESS
English
Article
The recent research work focuses on the realization of ITO/ZnO/Ag-based multifunctional devices. The fabricated devices exhibits multi-task operations, including ultraviolet (UV) light detection and non-volatile resistive switching (RS) memory applications. The intermediate ZnO switching layers were deposited using the spin-coating technique at 2500 rpm. The structural analysis validates the presence of wurtzite structure along the c-axis. The morphological analysis reveals that the grains are uniformly distributed of the deposited thin films. The PL emission spectrum of the ZnO thin film shows highly intensive peak at 382 nm. The obtained ZnO thin film was formed onto ITO substrate which was sandwiched between top and bottom Ag electrodes. The current-voltage measurements (I-V) and ln I-V plots characteristics of the fabricated ITO/ZnO/Ag devices were examined for UV photoresponse (under dark and UV illumination), and resistive switching (RS) behavior. The fabricated device shows a stable resistive switching characteristics and UV photoresponse with photoresponsivity (R) value of 0.52 mA W-1. The fabricated ITO/ZnO/Ag devices shows rise time 4.35 s and 9.25 s decay time respectively. The optical sensing mechanism of ITO/ZnO/Ag were explored by oxygen (O-2) adsorption/desorption processes in Ag/ZnO and ITO/ZnO junctions across the interface.
IOP Publishing Ltd
2631-8695

2025
7
1
10.1088/2631-8695/adbcfa
Engineering

WOS:001446987900001
https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001446987900001
title Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
title_short Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
title_full Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
title_fullStr Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
title_full_unstemmed Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
title_sort Modulation of structural and photoluminescence properties of ZnO thin films for photodetector and resistive switching applications
container_title ENGINEERING RESEARCH EXPRESS
language English
format Article
description The recent research work focuses on the realization of ITO/ZnO/Ag-based multifunctional devices. The fabricated devices exhibits multi-task operations, including ultraviolet (UV) light detection and non-volatile resistive switching (RS) memory applications. The intermediate ZnO switching layers were deposited using the spin-coating technique at 2500 rpm. The structural analysis validates the presence of wurtzite structure along the c-axis. The morphological analysis reveals that the grains are uniformly distributed of the deposited thin films. The PL emission spectrum of the ZnO thin film shows highly intensive peak at 382 nm. The obtained ZnO thin film was formed onto ITO substrate which was sandwiched between top and bottom Ag electrodes. The current-voltage measurements (I-V) and ln I-V plots characteristics of the fabricated ITO/ZnO/Ag devices were examined for UV photoresponse (under dark and UV illumination), and resistive switching (RS) behavior. The fabricated device shows a stable resistive switching characteristics and UV photoresponse with photoresponsivity (R) value of 0.52 mA W-1. The fabricated ITO/ZnO/Ag devices shows rise time 4.35 s and 9.25 s decay time respectively. The optical sensing mechanism of ITO/ZnO/Ag were explored by oxygen (O-2) adsorption/desorption processes in Ag/ZnO and ITO/ZnO junctions across the interface.
publisher IOP Publishing Ltd
issn 2631-8695

publishDate 2025
container_volume 7
container_issue 1
doi_str_mv 10.1088/2631-8695/adbcfa
topic Engineering
topic_facet Engineering
accesstype
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url https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001446987900001
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