Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC

Thermal stress and deformation analysis plays an important role in understanding the effects of heat on the performance and reliability of a 3D integrated circuit (IC) design. The demand for smaller and powerful electronic devices, 3D IC design gained prominence due to their superior integration cap...

Full description

Bibliographic Details
Published in:2024 IEEE 14TH SYMPOSIUM ON COMPUTER APPLICATIONS & INDUSTRIAL ELECTRONICS, ISCAIE 2024
Main Authors: Bin Sazali, Syamil; Hassan, Hasliza Binti; Yusof, Norliana; Husaini, Yusnira; Aziz, Anees Binti Abdul; Yaakub, Tuan Norjihan Binti Tuan
Format: Proceedings Paper
Language:English
Published: IEEE 2024
Subjects:
Online Access:https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001283898700088
author Bin Sazali
Syamil; Hassan
Hasliza Binti; Yusof
Norliana; Husaini
Yusnira; Aziz
Anees Binti Abdul; Yaakub
Tuan Norjihan Binti Tuan
spellingShingle Bin Sazali
Syamil; Hassan
Hasliza Binti; Yusof
Norliana; Husaini
Yusnira; Aziz
Anees Binti Abdul; Yaakub
Tuan Norjihan Binti Tuan
Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
Computer Science; Engineering
author_facet Bin Sazali
Syamil; Hassan
Hasliza Binti; Yusof
Norliana; Husaini
Yusnira; Aziz
Anees Binti Abdul; Yaakub
Tuan Norjihan Binti Tuan
author_sort Bin Sazali
spelling Bin Sazali, Syamil; Hassan, Hasliza Binti; Yusof, Norliana; Husaini, Yusnira; Aziz, Anees Binti Abdul; Yaakub, Tuan Norjihan Binti Tuan
Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
2024 IEEE 14TH SYMPOSIUM ON COMPUTER APPLICATIONS & INDUSTRIAL ELECTRONICS, ISCAIE 2024
English
Proceedings Paper
Thermal stress and deformation analysis plays an important role in understanding the effects of heat on the performance and reliability of a 3D integrated circuit (IC) design. The demand for smaller and powerful electronic devices, 3D IC design gained prominence due to their superior integration capabilities. The IC's components dissipate heat across several chip regions, which may cause localized overheating and a decline in performance and reliability. Hence, there is a growing need for innovative solutions to address this issue. The main objective of this project is to develop a 3D IC thermal model using Ansys Software. The study also aims to optimize the design parameters to predict the hot spots region in the 3D IC. The size of the intermetallic compound (IMC) joint, chip thickness, and load temperature were chosen as factors to evaluate the effect of various variables on the thermal stress of the 3D IC. The findings suggest that the temperature loading has a substantial impact on the thermal stress experienced by the 3D IC model. The IMC joint and chip interface were identified as the critical locations where higher thermal stress were perceived. Upon optimizing the variables, the thermal stress and deformation experienced a reduction of 1.25% and 0.36% respectively. In summary, the most effective design parameters for this study were determined to be a chip size of 0.9 mm, an IMC joint size of 0.1 mm, and a chip thickness of 0.12 mm. These parameters were obtained under the temperature load of 60 degrees C.
IEEE
2836-4864

2024


10.1109/ISCAIE61308.2024.10576559
Computer Science; Engineering

WOS:001283898700088
https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001283898700088
title Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
title_short Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
title_full Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
title_fullStr Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
title_full_unstemmed Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
title_sort Optimization of Design Parameters using Taguchi Method for Thermal Stress Analysis in a 3D IC
container_title 2024 IEEE 14TH SYMPOSIUM ON COMPUTER APPLICATIONS & INDUSTRIAL ELECTRONICS, ISCAIE 2024
language English
format Proceedings Paper
description Thermal stress and deformation analysis plays an important role in understanding the effects of heat on the performance and reliability of a 3D integrated circuit (IC) design. The demand for smaller and powerful electronic devices, 3D IC design gained prominence due to their superior integration capabilities. The IC's components dissipate heat across several chip regions, which may cause localized overheating and a decline in performance and reliability. Hence, there is a growing need for innovative solutions to address this issue. The main objective of this project is to develop a 3D IC thermal model using Ansys Software. The study also aims to optimize the design parameters to predict the hot spots region in the 3D IC. The size of the intermetallic compound (IMC) joint, chip thickness, and load temperature were chosen as factors to evaluate the effect of various variables on the thermal stress of the 3D IC. The findings suggest that the temperature loading has a substantial impact on the thermal stress experienced by the 3D IC model. The IMC joint and chip interface were identified as the critical locations where higher thermal stress were perceived. Upon optimizing the variables, the thermal stress and deformation experienced a reduction of 1.25% and 0.36% respectively. In summary, the most effective design parameters for this study were determined to be a chip size of 0.9 mm, an IMC joint size of 0.1 mm, and a chip thickness of 0.12 mm. These parameters were obtained under the temperature load of 60 degrees C.
publisher IEEE
issn 2836-4864

publishDate 2024
container_volume
container_issue
doi_str_mv 10.1109/ISCAIE61308.2024.10576559
topic Computer Science; Engineering
topic_facet Computer Science; Engineering
accesstype
id WOS:001283898700088
url https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001283898700088
record_format wos
collection Web of Science (WoS)
_version_ 1823296086683418624