The Effects of NBTI and PBTI on SRAM Characteristics
Negative/Positive Bias Temperature Instability (N / PBTI) is one of the most important readability issues due to aggressive technology scaling. The transistor performance will degrade and eventually reduce the performance of the circuit. As SRAM is a widely used circuit in microprocessors, it is imp...
| 出版年: | 2024 IEEE 22nd Student Conference on Research and Development, SCOReD 2024 |
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| 第一著者: | |
| フォーマット: | Conference paper |
| 言語: | English |
| 出版事項: |
Institute of Electrical and Electronics Engineers Inc.
2024
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| オンライン･アクセス: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85219553137&doi=10.1109%2fSCOReD64708.2024.10872693&partnerID=40&md5=0482d91a579eb80a47b7dfd4a34b7bd4 |