NBTI Defects Characterization Using Energy Profiling Simulation Technique

NBTI Defects Characterization Using Energy Profiling Simulation Technique

A numerical simulation framework to simulate the positive charges based on location of energy levels is conducted in this work. This framework utilizes an energy profiling approach, where the behavior of hole traps under stress conditions is studied. In this process, a recovery voltage is applied to...

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Bibliographic Details
Published in:Proceedings - 2023 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2023
Main Author: Hussin H.; Wan S.F.; Soin N.; Wahab Y.A.; Muhamad M.; Alias N.E.
Format: Conference paper
Language:English
Published: Institute of Electrical and Electronics Engineers Inc. 2023
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85179837175&doi=10.1109%2fRSM59033.2023.10326770&partnerID=40&md5=12d3a1c41bfce0ea91dedd8aca95b22a

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https://www.scopus.com/inward/record.uri?eid=2-s2.0-85179837175&doi=10.1109%2fRSM59033.2023.10326770&partnerID=40&md5=12d3a1c41bfce0ea91dedd8aca95b22a

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