ANALYSIS OF NBTI EFFECTS ON READ AND WRITE OPERATIONS OF 6T SRAM CELLS
Negative Bias Temperature Instability (NBTI) is an important reliability issue in CMOS devices that affects the performance of CMOS-based circuits. Therefore, it is vital to comprehend the impact of different defect mechanisms and wide operating conditions about stress and recovery time on the circu...
| Published in: | Journal of Engineering Science and Technology |
|---|---|
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
| Published: |
Taylor's University
2022
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85146073088&partnerID=40&md5=a607f85088bb721415c4b137cfaeae04 |