Failure prediction of the solder joints in the ball-grid-array package under thermal loading
This paper studies the numerical failure mechanism of the solder joints in the ball grid array (BGA) package under thermal reliability process. The package consists of the silicon die, the Flame Retardant 4 (FR-4) substrate and the FR-4 printed circuit board (PCB). A total of 64 95.5Sn-4.0Ag-0.5Cu (...
Published in: | Journal of Physics: Conference Series |
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Main Author: | Yamin A.F.M.; Abdullah A.S.; Manap M.F.A.; Yusoff H. |
Format: | Conference paper |
Language: | English |
Published: |
Institute of Physics Publishing
2019
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Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85077798675&doi=10.1088%2f1742-6596%2f1349%2f1%2f012013&partnerID=40&md5=d42d9dc9f3110db6124c7f9c9c7853ed |
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