Investigation on the effect of delay time during pulse chemical etching of porous silicon formation
A set of porous silicon (PS) layers was produced by the pulse current (PC) etching technique using a solution of HF:C2H6O in a composition ratio of 1:4 with delay time varying from 0 to 4 minutes. The set was compared with the one porous silicon sample that was etched by using the conventional direc...
Published in: | Acta Physica Polonica A |
---|---|
Main Author: | Wahab N.H.A.; Rahim A.F.A.; Mahmood A.; Radzali R.; Yusof Y. |
Format: | Article |
Language: | English |
Published: |
Polish Academy of Sciences
2019
|
Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85071160457&doi=10.12693%2fAPhysPolA.135.873&partnerID=40&md5=a7ba7a608e066bfd33e34bf6f916d452 |
Similar Items
-
Influence of different etching methods on the structural properties of porous silicon
by: Zulkifli F.; Radzali R.; Abd Rahim A.F.; Mahmood A.; Mohd Razali N.S.; Abu Bakar A.
Published: (2022) -
Investigation of light trapping from porous silicon surface for the enhancement of silicon solar cell performance
by: Rahim A.F.A.; Ahmed M.A.; Razali N.S.M.; Radzali R.; Mahmood A.; Hamzah I.H.; Noorsal E.
Published: (2019) -
Study of Porous III-V Surface Structure Via Etching Process: Effect of Pore Depth
by: Ramle M.R.; Radzali R.; Rahim A.F.A.; Mahmood A.; Bakar A.A.; Daud A.N.M.; Abdullah M.H.
Published: (2023) -
Etching Time On Structural And Electrical Properties Of Porous Silicon Sers Substrates For Non-Invasive Dengue-Ns1 Detection
by: Ismail N.F.; Ismail L.N.; Lee K.Y.; Zulhanip A.Z.; Hadis N.S.M.; Radzol A.R.M.
Published: (2021) -
I-V and surface topography study of nanostructure porous silicon layer prepared by electrochemical etching
by: Husairi F.S.; Ain Zubaidah M.; Yusop S.F.M.; Rusop M.; Abdullah S.
Published: (2012)