Trigger-When-Charged: A technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-V dd
Low-power circuits are important for many applications, such as Internet of Things. Device variations and fluctuations are challenging their design. Random telegraph noise (RTN) is an important source of fluctuation. To verify a design by simulation, one needs assessing...
| Published in: | IEEE Transactions on Electron Devices |
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| Main Author: | |
| Format: | Article |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers Inc.
2019
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85062260875&doi=10.1109%2fTED.2019.2895700&partnerID=40&md5=06254a4dea8397fa464695ad2af93108 |