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Manut A.; Gao R.; Zhang J.F.; Ji Z.; Mehedi M.; Zhang W.D.; Vigar D.; Asenov A.; Kaczer B.
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Manut A.; Gao R.; Zhang J.F.; Ji Z.; Mehedi M.; Zhang W.D.; Vigar D.; Asenov A.; Kaczer B.
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Manut A.; Gao R.; Zhang J.F.; Ji Z.; Mehedi M.; Zhang W.D.; Vigar D.; Asenov A.; Kaczer B.
'
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Trigger-When-Charged: A technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-V dd
by
Manut
A
.;
Gao
R
.;
Zhang
J.F
.;
Ji
Z
.;
Mehedi
M
.;
Zhang
W.D
.;
Vigar
D
.;
Asenov
A
.;
Kaczer
B
.
Published in
IEEE Transactions on Electron Devices
(2019)
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