Raman studied of undoped amorphous carbon thin film deposited by bias assisted-CVD

• Published in: AIP Conference Proceedings
• Main Author: Ishak A.; Fadzilah A.N.; Dayana K.; Saurdi I.; Malek M.F.; Nurbaya Z.; Shafura A.K.; Rusop M.
• Format: Conference paper
• Language: English
• Published: American Institute of Physics Inc. 2018
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85047315005&doi=10.1063%2f1.5036890&partnerID=40&md5=df0be4566af67327f086e0514a2a5b7d

The undoped amorphous carbon thin film carbon was deposited at 200°C-350°C by bias assisted-CVD using palm oil as a precursor material. The effect of different substrate deposition temperatures on structural and electrical properties of undoped doped amorphous carbon film was discussed. The structural of undoped amorphous carbon films were correlated with Raman analysis through the evolution of D and G bands, Fourier spectra, and conductivity measurement. The spectral evolution observed showed the increase of upward shift of D and G peaks as substrate deposition temperatures increased. The spectral evolution observed at different substrate deposition temperatures show progressive formation of crystallites. It was predicted that small number of hydrogen is terminated with carbon at surface of thin film as shown by FTIR spectra since palm oil has high number of hydrogen (C67H127O8). These structural changes were further correlated with conductivity and the results obtained are discussed and compared. The conductivity is found in the range of 10-8 Scm-1. The increase of conductivity is correlated by the change of structural properties as correlated with characteristic parameters of Raman spectra including the position of G peak, full width at half maximum of G peak, and ID/IG and FTIR result. © 2018 Author(s).