On-wafer scattering parameter characterization of differential four-port networks LNA using two-port vector network analyzer
This paper presents a technique that enables very accurate measurement for S-parameter of differential low noise amplifier by means of a standard two-port vector network analyzer (VNA). This technique involves by terminating two ports at one time while another two ports are measured. Accurate charac...
| Published in: | IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE |
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| Main Author: | |
| Format: | Conference paper |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers Inc.
2014
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84908256201&doi=10.1109%2fSMELEC.2014.6920867&partnerID=40&md5=3865a2ea1e5b3f0e9b03832cd0c92392 |