On-wafer scattering parameter characterization of differential four-port networks LNA using two-port vector network analyzer

On-wafer scattering parameter characterization of differential four-port networks LNA using two-port vector network analyzer

This paper presents a technique that enables very accurate measurement for S-parameter of differential low noise amplifier by means of a standard two-port vector network analyzer (VNA). This technique involves by terminating two ports at one time while another two ports are measured. Accurate charac...

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Bibliographic Details
Published in:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
Main Author: Muhamad M.; Soin N.; Ramiah H.; Noh N.M.; Keat C.W.
Format: Conference paper
Language:English
Published: Institute of Electrical and Electronics Engineers Inc. 2014
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84908256201&doi=10.1109%2fSMELEC.2014.6920867&partnerID=40&md5=3865a2ea1e5b3f0e9b03832cd0c92392

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https://www.scopus.com/inward/record.uri?eid=2-s2.0-84908256201&doi=10.1109%2fSMELEC.2014.6920867&partnerID=40&md5=3865a2ea1e5b3f0e9b03832cd0c92392

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