Structural and surface studies of undoped porous GaN grown on sapphire
Owing to its great potential in optoelectronic devices, structural and surface properties of porous GaN prepared by UV electrochemical etching has been investigated. Scanning electron microscopy (SEM), atomic force microscopy (AFM) and high resolution X-ray diffraction (HRXRD) phi-scan and rocking c...
Published in: | Advanced Materials Research |
---|---|
Main Author: | Mahmood A.; Hassan Z.; Yusof Y.; Kwong Y.F.; Siang C.L.; Ahmed N.M. |
Format: | Conference paper |
Language: | English |
Published: |
2013
|
Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84871917990&doi=10.4028%2fwww.scientific.net%2fAMR.620.45&partnerID=40&md5=258e87a3f6f10750445909b78fc2f376 |
Similar Items
-
A Novel AC technique for high quality porous GaN
by: Mahmood A.; Ahmed N.M.; Yusof Y.; Kwong Y.F.; Siang C.L.; Abd H.R.; Hassan Z.
Published: (2013) -
Role of GaN cap layer for reference electrode free AlGaN/GaN-based pH sensors
by: Parish G.; Khir F.L.M.; Krishnan N.R.; Wang J.; Krisjanto J.S.; Li H.; Umana-Membreno G.A.; Keller S.; Mishra U.K.; Baker M.V.; Nener B.D.; Myers M.
Published: (2019) -
Enhanced Breakdown Voltage of AlGaN/GaN MISHEMT using GaN Buffer with Carbon-Doping on Silicon for Power Device
by: Islam N.; Mohamed M.F.P.; Rahman S.F.A.; Syamsul M.; Kawarada H.; Rahim A.F.A.
Published: (2024) -
XPS/NEXAFS spectroscopic and conductance studies of glycine on AlGaN/GaN transistor devices
by: Myers M.; Khir F.L.M.; Home M.A.; Mennell C.; Gillbanks J.; Tadich A.; Baker M.V.; Nener B.D.; Parish G.
Published: (2018) -
Analysis of the influence of the traps on the AlGaN/GaN MOSHEMT characteristics for low leakage power devices
by: Islam N.; Baharin M.S.N.S.; Rahim A.F.A.; Khan M.F.A.J.; Ghazali N.A.; Bakar A.S.A.; Mohamed M.F.P.
Published: (2024)