Factor-space dimension reduction for sensitivity analysis of intelligent electronic devices

Implementation of uncertainty and sensitivity analysis for testing measurement accuracy of a commercial Intelligent Electronic Device (IED) requires unaffordable number of an IED tests. The main reason is a large number of factors (i.e. high dimension of factor space) that potentially affects the ac...

全面介紹

書目詳細資料
發表在:IEEE Region 10 Annual International Conference, Proceedings/TENCON
主要作者: Ibrahim M.N.; Zivanovic R.
格式: Conference paper
語言:English
出版: 2011
在線閱讀:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84856869474&doi=10.1109%2fTENCON.2011.6129268&partnerID=40&md5=b96fbf5d8636b883f2b06587e27bc05f

相似書籍