Reliability Analysis of Multibridge Channel Field Effect Transistor

by Ganlin H.; Alias N.E.; Tan M.L.P.; Hamzah M.N.; Wahab Y.A.; Hussin H.
Published in IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE (2024)

Reliability Analysis of Multibridge Channel Field Effect Transistor

by Ganlin, Huang; Alias, N. Ezaila; Tan, M. L. Peng; Hamzah, M. N.; Wahab, Yasmin Abdul; Hussin, Hanim
Published in 2024 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, ICSE (2024)