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Azman N.S.B.; Hadi M.F.A.; Hussin H.; Mohamed A.H.; Yusoff M.Z.M.
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Azman N.S.B.; Hadi M.F.A.; Hussin H.; Mohamed A.H.; Yusoff M.Z.M.
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Exploring the Impact of Negative Bias Temperature Instability in SiGe p-MOSFETs Utilizing a Two-Stage Model
by
Azman
N.S.B
.;
Hadi
M.F.A
.;
Hussin
H
.;
Mohamed
A.H
.;
Yusoff
M.Z.M
.
Published in
Malaysian Journal of Chemistry
(2024)
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