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Alhan Farhanah
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Impact of Nanowire Radius and Channel Thickness with High-k Gate Dielectric in GAA-JLT
by
Vespanathan
,
Nilaventhiran; Othman
,
Noraini; Sabki
,
S. N.; Abd Rahim
,
Alhan Farhanah
Published in
INTERNATIONAL JOURNAL OF NANOELECTRONICS AND MATERIALS
(2023)
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