APA引文

Li, Hamzah, A., Rahim, R., & Abdu, S. K. N. (2025). A chip X-ray image bubble defect detection model combined with Dual-Former attention mechanism. MEASUREMENT, 248, . https://doi.org/10.1016/j.measurement.2025.116871

Chicago Style (17th ed.) Citation

Li, Ang Hamzah, Raseeda Rahim, and Siti Khatijah Nor Abdu. "A Chip X-ray Image Bubble Defect Detection Model Combined with Dual-Former Attention Mechanism." MEASUREMENT 248 (2025). https://doi.org/10.1016/j.measurement.2025.116871.

MLA引文

Li, et al. "A Chip X-ray Image Bubble Defect Detection Model Combined with Dual-Former Attention Mechanism." MEASUREMENT, vol. 248, 2025, https://doi.org/10.1016/j.measurement.2025.116871.