Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning

Effective software defect prediction is a crucial aspect of software quality assurance, enabling the identification of defective modules before the testing phase. This study aims to propose a comprehensive five-stage framework for software defect prediction, addressing the current challenges in the...

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Published in:PEERJ COMPUTER SCIENCE
Main Authors: Ali, Misbah; Mazhar, Tehseen; Al-Rasheed, Amal; Shahzad, Tariq; Ghadi, Yazeed Yasin; Khan, Muhammad Amir
Format: Article
Language:English
Published: PEERJ INC 2024
Subjects:
Online Access:https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001174202200001
author Ali
Misbah; Mazhar
Tehseen; Al-Rasheed
Amal; Shahzad
Tariq; Ghadi
Yazeed Yasin; Khan
Muhammad Amir
spellingShingle Ali
Misbah; Mazhar
Tehseen; Al-Rasheed
Amal; Shahzad
Tariq; Ghadi
Yazeed Yasin; Khan
Muhammad Amir
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
Computer Science
author_facet Ali
Misbah; Mazhar
Tehseen; Al-Rasheed
Amal; Shahzad
Tariq; Ghadi
Yazeed Yasin; Khan
Muhammad Amir
author_sort Ali
spelling Ali, Misbah; Mazhar, Tehseen; Al-Rasheed, Amal; Shahzad, Tariq; Ghadi, Yazeed Yasin; Khan, Muhammad Amir
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
PEERJ COMPUTER SCIENCE
English
Article
Effective software defect prediction is a crucial aspect of software quality assurance, enabling the identification of defective modules before the testing phase. This study aims to propose a comprehensive five-stage framework for software defect prediction, addressing the current challenges in the field. The first stage involves selecting a cleaned version of NASA's defect datasets, including CM1, JM1, MC2, MW1, PC1, PC3, and PC4, ensuring the data's integrity. In the second stage, a feature selection technique based on the genetic algorithm is applied to identify the optimal subset of features. In the third stage, three heterogeneous binary classifiers, namely random forest, support vector machine, and naive Bayes, are implemented as base classifiers. Through iterative tuning, the classifiers are optimized to achieve the highest level of accuracy individually. In the fourth stage, an ensemble machine-learning technique known as voting is applied as a master classifier, leveraging the collective decision-making power of the base classifiers. The final stage evaluates the performance of the proposed framework using five widely recognized performance evaluation measures: precision, recall, accuracy, Fmeasure, and area under the curve. Experimental results demonstrate that the proposed framework outperforms state-of-the-art ensemble and base classifiers employed in software defect prediction and achieves a maximum accuracy of 95.1%, showing its effectiveness in accurately identifying software defects. The framework also evaluates its efficiency by calculating execution times. Notably, it exhibits enhanced efficiency, significantly reducing the execution times during the training and testing phases by an average of 51.52% and 52.31%, respectively. This reduction contributes to a more computationally economical solution for accurate software defect prediction.
PEERJ INC

2376-5992
2024
10

10.7717/peerj-cs.1860
Computer Science
gold
WOS:001174202200001
https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001174202200001
title Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
title_short Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
title_full Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
title_fullStr Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
title_full_unstemmed Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
title_sort Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
container_title PEERJ COMPUTER SCIENCE
language English
format Article
description Effective software defect prediction is a crucial aspect of software quality assurance, enabling the identification of defective modules before the testing phase. This study aims to propose a comprehensive five-stage framework for software defect prediction, addressing the current challenges in the field. The first stage involves selecting a cleaned version of NASA's defect datasets, including CM1, JM1, MC2, MW1, PC1, PC3, and PC4, ensuring the data's integrity. In the second stage, a feature selection technique based on the genetic algorithm is applied to identify the optimal subset of features. In the third stage, three heterogeneous binary classifiers, namely random forest, support vector machine, and naive Bayes, are implemented as base classifiers. Through iterative tuning, the classifiers are optimized to achieve the highest level of accuracy individually. In the fourth stage, an ensemble machine-learning technique known as voting is applied as a master classifier, leveraging the collective decision-making power of the base classifiers. The final stage evaluates the performance of the proposed framework using five widely recognized performance evaluation measures: precision, recall, accuracy, Fmeasure, and area under the curve. Experimental results demonstrate that the proposed framework outperforms state-of-the-art ensemble and base classifiers employed in software defect prediction and achieves a maximum accuracy of 95.1%, showing its effectiveness in accurately identifying software defects. The framework also evaluates its efficiency by calculating execution times. Notably, it exhibits enhanced efficiency, significantly reducing the execution times during the training and testing phases by an average of 51.52% and 52.31%, respectively. This reduction contributes to a more computationally economical solution for accurate software defect prediction.
publisher PEERJ INC
issn
2376-5992
publishDate 2024
container_volume 10
container_issue
doi_str_mv 10.7717/peerj-cs.1860
topic Computer Science
topic_facet Computer Science
accesstype gold
id WOS:001174202200001
url https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001174202200001
record_format wos
collection Web of Science (WoS)
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