Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning
Effective software defect prediction is a crucial aspect of software quality assurance, enabling the identification of defective modules before the testing phase. This study aims to propose a comprehensive five-stage framework for software defect prediction, addressing the current challenges in the...
Published in: | PEERJ COMPUTER SCIENCE |
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Language: | English |
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PEERJ INC
2024
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Online Access: | https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001174202200001 |
author |
Ali Misbah; Mazhar Tehseen; Al-Rasheed Amal; Shahzad Tariq; Ghadi Yazeed Yasin; Khan Muhammad Amir |
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Ali Misbah; Mazhar Tehseen; Al-Rasheed Amal; Shahzad Tariq; Ghadi Yazeed Yasin; Khan Muhammad Amir Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning Computer Science |
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Ali Misbah; Mazhar Tehseen; Al-Rasheed Amal; Shahzad Tariq; Ghadi Yazeed Yasin; Khan Muhammad Amir |
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Ali |
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Ali, Misbah; Mazhar, Tehseen; Al-Rasheed, Amal; Shahzad, Tariq; Ghadi, Yazeed Yasin; Khan, Muhammad Amir Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning PEERJ COMPUTER SCIENCE English Article Effective software defect prediction is a crucial aspect of software quality assurance, enabling the identification of defective modules before the testing phase. This study aims to propose a comprehensive five-stage framework for software defect prediction, addressing the current challenges in the field. The first stage involves selecting a cleaned version of NASA's defect datasets, including CM1, JM1, MC2, MW1, PC1, PC3, and PC4, ensuring the data's integrity. In the second stage, a feature selection technique based on the genetic algorithm is applied to identify the optimal subset of features. In the third stage, three heterogeneous binary classifiers, namely random forest, support vector machine, and naive Bayes, are implemented as base classifiers. Through iterative tuning, the classifiers are optimized to achieve the highest level of accuracy individually. In the fourth stage, an ensemble machine-learning technique known as voting is applied as a master classifier, leveraging the collective decision-making power of the base classifiers. The final stage evaluates the performance of the proposed framework using five widely recognized performance evaluation measures: precision, recall, accuracy, Fmeasure, and area under the curve. Experimental results demonstrate that the proposed framework outperforms state-of-the-art ensemble and base classifiers employed in software defect prediction and achieves a maximum accuracy of 95.1%, showing its effectiveness in accurately identifying software defects. The framework also evaluates its efficiency by calculating execution times. Notably, it exhibits enhanced efficiency, significantly reducing the execution times during the training and testing phases by an average of 51.52% and 52.31%, respectively. This reduction contributes to a more computationally economical solution for accurate software defect prediction. PEERJ INC 2376-5992 2024 10 10.7717/peerj-cs.1860 Computer Science gold WOS:001174202200001 https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001174202200001 |
title |
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning |
title_short |
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning |
title_full |
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning |
title_fullStr |
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning |
title_full_unstemmed |
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning |
title_sort |
Enhancing software defect prediction: a framework with improved feature selection and ensemble machine learning |
container_title |
PEERJ COMPUTER SCIENCE |
language |
English |
format |
Article |
description |
Effective software defect prediction is a crucial aspect of software quality assurance, enabling the identification of defective modules before the testing phase. This study aims to propose a comprehensive five-stage framework for software defect prediction, addressing the current challenges in the field. The first stage involves selecting a cleaned version of NASA's defect datasets, including CM1, JM1, MC2, MW1, PC1, PC3, and PC4, ensuring the data's integrity. In the second stage, a feature selection technique based on the genetic algorithm is applied to identify the optimal subset of features. In the third stage, three heterogeneous binary classifiers, namely random forest, support vector machine, and naive Bayes, are implemented as base classifiers. Through iterative tuning, the classifiers are optimized to achieve the highest level of accuracy individually. In the fourth stage, an ensemble machine-learning technique known as voting is applied as a master classifier, leveraging the collective decision-making power of the base classifiers. The final stage evaluates the performance of the proposed framework using five widely recognized performance evaluation measures: precision, recall, accuracy, Fmeasure, and area under the curve. Experimental results demonstrate that the proposed framework outperforms state-of-the-art ensemble and base classifiers employed in software defect prediction and achieves a maximum accuracy of 95.1%, showing its effectiveness in accurately identifying software defects. The framework also evaluates its efficiency by calculating execution times. Notably, it exhibits enhanced efficiency, significantly reducing the execution times during the training and testing phases by an average of 51.52% and 52.31%, respectively. This reduction contributes to a more computationally economical solution for accurate software defect prediction. |
publisher |
PEERJ INC |
issn |
2376-5992 |
publishDate |
2024 |
container_volume |
10 |
container_issue |
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doi_str_mv |
10.7717/peerj-cs.1860 |
topic |
Computer Science |
topic_facet |
Computer Science |
accesstype |
gold |
id |
WOS:001174202200001 |
url |
https://www-webofscience-com.uitm.idm.oclc.org/wos/woscc/full-record/WOS:001174202200001 |
record_format |
wos |
collection |
Web of Science (WoS) |
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1809678796480053248 |