2-s2.0-85185816454. (2024). Fault injection test on mitigated benchmark circuits using FPGA. AIP Conference Proceedings, 2898(1), . https://doi.org/10.1063/5.0192276
芝加哥风格引文2-s2.0-85185816454. "Fault Injection Test on Mitigated Benchmark Circuits Using FPGA." AIP Conference Proceedings 2898, no. 1 (2024). https://doi.org/10.1063/5.0192276.
MLA引文2-s2.0-85185816454. "Fault Injection Test on Mitigated Benchmark Circuits Using FPGA." AIP Conference Proceedings, vol. 2898, no. 1, 2024, https://doi.org/10.1063/5.0192276.
警告:这些引文格式不一定是100%准确.