Optical characterization of porous silicon (PS) doped Erbium (Er) using photoluminescence spectroscopy

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Optical characterization of porous silicon (PS) doped Erbium (Er) using photoluminescence spectroscopy

The optical properties of porous silicon (PS) doped Erbium (Er) for different amount of Er was investigated.Porous silicon was prepared using electrochemical etching on p-type Si.The weight of Er varies from 0.01g, 0.02, 0.03g and 0.04g and was doped using thermal diffusion technique. Sample was ann...

書誌詳細
出版年:	Advanced Materials Research
第一著者:	2-s2.0-84891602122
フォーマット:	Conference paper
言語:	English
出版事項:	2014
オンライン･アクセス:	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84891602122&doi=10.4028%2fwww.scientific.net%2fAMR.832.617&partnerID=40&md5=97960b8495b78353a01af39110c1f17d

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