The Effects of NBTI and PBTI on SRAM Characteristics

Negative/Positive Bias Temperature Instability (N / PBTI) is one of the most important readability issues due to aggressive technology scaling. The transistor performance will degrade and eventually reduce the performance of the circuit. As SRAM is a widely used circuit in microprocessors, it is imp...

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发表在:2024 IEEE 22nd Student Conference on Research and Development, SCOReD 2024
主要作者: 2-s2.0-85219553137
格式: Conference paper
语言:English
出版: Institute of Electrical and Electronics Engineers Inc. 2024
在线阅读:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85219553137&doi=10.1109%2fSCOReD64708.2024.10872693&partnerID=40&md5=0482d91a579eb80a47b7dfd4a34b7bd4