2-s2.0-84859984277. (2011). RF characterization of Mg 0.2Zn 0.8O thin film capacitors for MMIC applications. 2011 IEEE International RF and Microwave Conference, RFM 2011 - Proceedings. https://doi.org/10.1109/RFM.2011.6168781
Chicagoスタイル(17版)引用形式2-s2.0-84859984277. "RF Characterization of Mg 0.2Zn 0.8O Thin Film Capacitors for MMIC Applications." 2011 IEEE International RF and Microwave Conference, RFM 2011 - Proceedings 2011. https://doi.org/10.1109/RFM.2011.6168781.
MLA(8版)引用形式2-s2.0-84859984277. "RF Characterization of Mg 0.2Zn 0.8O Thin Film Capacitors for MMIC Applications." 2011 IEEE International RF and Microwave Conference, RFM 2011 - Proceedings, 2011, https://doi.org/10.1109/RFM.2011.6168781.
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