APA引文

B.T, M. A. M. L. M. S. N. S. P. J. L. S. T. (2024). Design and Development of Testing Kit for KNX Devices Reliability and Performance Measurement. IEEE International Conference on Industrial Engineering and Engineering Management. https://doi.org/10.1109/IEEM62345.2024.10857268

Chicago Style (17th ed.) Citation

B.T, Mohammad Aizam M.A.R.; Lee M.F.; Sanusi N.A.; Siew P.W.; Johnson Lim S.C.; Tee. "Design and Development of Testing Kit for KNX Devices Reliability and Performance Measurement." IEEE International Conference on Industrial Engineering and Engineering Management 2024. https://doi.org/10.1109/IEEM62345.2024.10857268.

MLA引文

B.T, Mohammad Aizam M.A.R.; Lee M.F.; Sanusi N.A.; Siew P.W.; Johnson Lim S.C.; Tee. "Design and Development of Testing Kit for KNX Devices Reliability and Performance Measurement." IEEE International Conference on Industrial Engineering and Engineering Management, 2024, https://doi.org/10.1109/IEEM62345.2024.10857268.