Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures
This study describes the RF magnetron sputtering growth of nickel (Ni) doped zinc oxide (ZnO) thin films with nanocolumns (NCs) structures. Using a nickel seed layer, homogeneous and vertically aligned ZnO nanocolumns with a diameter of around 30 nm were successfully grown. The X-ray diffraction (XR...
Published in: | Journal of Crystal Growth |
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Elsevier B.V.
2024
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Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85199941366&doi=10.1016%2fj.jcrysgro.2024.127835&partnerID=40&md5=b7019d3fa571510075bc2dd4b526b4ab |
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2-s2.0-85199941366 Mazwan M.; Ng S.S.; Samsol Baharin M.S.N.; Pakhuruddin M.Z.; Abu Bakar A.S.; Abd. Rahman M.N.; Al- Zuhairi O.; Abd Rahim A.F. Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures 2024 Journal of Crystal Growth 644 10.1016/j.jcrysgro.2024.127835 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85199941366&doi=10.1016%2fj.jcrysgro.2024.127835&partnerID=40&md5=b7019d3fa571510075bc2dd4b526b4ab This study describes the RF magnetron sputtering growth of nickel (Ni) doped zinc oxide (ZnO) thin films with nanocolumns (NCs) structures. Using a nickel seed layer, homogeneous and vertically aligned ZnO nanocolumns with a diameter of around 30 nm were successfully grown. The X-ray diffraction (XRD) results confirmed the incorporation of Ni atoms into the ZnO lattice, producing single crystalline structures without secondary phases. High-resolution transmission electron microscopy showed clear lattice planes with a d-spacing value of 3.243 Å corresponding to the wurtzite phase of ZnO. Optimal crystalline quality was achieved by growing the films at 300 °C followed by thermal annealing at 300–500 °C in an oxygen ambient. © 2024 Elsevier B.V. Elsevier B.V. 220248 English Article |
author |
Mazwan M.; Ng S.S.; Samsol Baharin M.S.N.; Pakhuruddin M.Z.; Abu Bakar A.S.; Abd. Rahman M.N.; Al- Zuhairi O.; Abd Rahim A.F. |
spellingShingle |
Mazwan M.; Ng S.S.; Samsol Baharin M.S.N.; Pakhuruddin M.Z.; Abu Bakar A.S.; Abd. Rahman M.N.; Al- Zuhairi O.; Abd Rahim A.F. Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures |
author_facet |
Mazwan M.; Ng S.S.; Samsol Baharin M.S.N.; Pakhuruddin M.Z.; Abu Bakar A.S.; Abd. Rahman M.N.; Al- Zuhairi O.; Abd Rahim A.F. |
author_sort |
Mazwan M.; Ng S.S.; Samsol Baharin M.S.N.; Pakhuruddin M.Z.; Abu Bakar A.S.; Abd. Rahman M.N.; Al- Zuhairi O.; Abd Rahim A.F. |
title |
Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures |
title_short |
Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures |
title_full |
Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures |
title_fullStr |
Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures |
title_full_unstemmed |
Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures |
title_sort |
Radio frequency magnetron sputtering growth of Ni-doped ZnO thin films with nanocolumnar structures |
publishDate |
2024 |
container_title |
Journal of Crystal Growth |
container_volume |
644 |
container_issue |
|
doi_str_mv |
10.1016/j.jcrysgro.2024.127835 |
url |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85199941366&doi=10.1016%2fj.jcrysgro.2024.127835&partnerID=40&md5=b7019d3fa571510075bc2dd4b526b4ab |
description |
This study describes the RF magnetron sputtering growth of nickel (Ni) doped zinc oxide (ZnO) thin films with nanocolumns (NCs) structures. Using a nickel seed layer, homogeneous and vertically aligned ZnO nanocolumns with a diameter of around 30 nm were successfully grown. The X-ray diffraction (XRD) results confirmed the incorporation of Ni atoms into the ZnO lattice, producing single crystalline structures without secondary phases. High-resolution transmission electron microscopy showed clear lattice planes with a d-spacing value of 3.243 Å corresponding to the wurtzite phase of ZnO. Optimal crystalline quality was achieved by growing the films at 300 °C followed by thermal annealing at 300–500 °C in an oxygen ambient. © 2024 Elsevier B.V. |
publisher |
Elsevier B.V. |
issn |
220248 |
language |
English |
format |
Article |
accesstype |
|
record_format |
scopus |
collection |
Scopus |
_version_ |
1809678469428150272 |