Model Updating of a Bolted Joint Contact Surface Using Thin Layer Element Parameters

The dynamic behaviour prediction scheme of contact surface of bolt joints has found to be extremely difficult to model due the complex behaviour of the structural joints. In this paper, the bolted structure was used with aim to investigate the dynamic behaviour of the bolted structure using practica...

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Bibliographic Details
Published in:AIP Conference Proceedings
Main Author: Abdul Rani M.N.; Yunus M.A.; Yahya Z.; Rusli M.; Bahari A.R.
Format: Conference paper
Language:English
Published: American Institute of Physics 2024
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85188304630&doi=10.1063%2f5.0188547&partnerID=40&md5=ee21fd9ea25d0162d01e4692db944adb
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Summary:The dynamic behaviour prediction scheme of contact surface of bolt joints has found to be extremely difficult to model due the complex behaviour of the structural joints. In this paper, the bolted structure was used with aim to investigate the dynamic behaviour of the bolted structure using practical modelling scheme via finite element modelling and updating method. A simplified FE model of the bolted structure was developed using CBEAM element to represent geometrical shape of the bolt and Thin Layer Element (TLE) was used to represent the contact surface of the bolted structure. Subsequently, the normal mode analysis using NASTRAN103 was used to predict the dynamic behaviour of the FE model. Potential updating parameters of the FE model was analysed by implemented sensitivity analysis formulated in Nastran SOL200. The model updating method is then used to update the initial FE model of the bolted structure based on the experimental modal analysis (EMA) result. The comparison of the results is used in verifying the accuracy of the updated FE model of the bolted joint structure. The result suggested that the CBEAM and TLE can be used efficiently to represent the bolted joints and the contact surface of the bolted joint of the assembled structure. © 2024 American Institute of Physics Inc.. All rights reserved.
ISSN:0094243X
DOI:10.1063/5.0188547