Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate

The study used magnetron sputtering to investigate the growth of cadmium telluride (CdTe) thin films on surface treated n-type silicon (n-Si) substrates. The n-Si substrates were textured using potassium hydroxide (KOH) before the sputter deposition of CdTe. This was followed by cadmium chloride tre...

Full description

Bibliographic Details
Published in:Heliyon
Main Author: Isah M.; Doroody C.; Rahman K.S.; Harif M.N.; Kiong T.S.; Zuhdi A.W.M.
Format: Article
Language:English
Published: Elsevier Ltd 2023
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85175331621&doi=10.1016%2fj.heliyon.2023.e21536&partnerID=40&md5=cb9848c1d8247ed5c1512cd93159e252
id 2-s2.0-85175331621
spelling 2-s2.0-85175331621
Isah M.; Doroody C.; Rahman K.S.; Harif M.N.; Kiong T.S.; Zuhdi A.W.M.
Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
2023
Heliyon
9
11
10.1016/j.heliyon.2023.e21536
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85175331621&doi=10.1016%2fj.heliyon.2023.e21536&partnerID=40&md5=cb9848c1d8247ed5c1512cd93159e252
The study used magnetron sputtering to investigate the growth of cadmium telluride (CdTe) thin films on surface treated n-type silicon (n-Si) substrates. The n-Si substrates were textured using potassium hydroxide (KOH) before the sputter deposition of CdTe. This was followed by cadmium chloride treatment to reduce the strain at the interface of CdTe and Si, which is caused by the incompatible lattice and thermal expansion mismatch (CTE). X-ray diffraction (XRD) analysis showed that the lowest FWHM and dislocation densities were obtained for CdCl2/CdTe/txt-nSi, which aligns with the scanning electron microscopy (SEM) results. In the SEM images, the interface bonding between the CdTe and Si surfaces was visible in the cross-sections, and the top-view images revealed sputtered CdTe thin films conforming to the patterns of pyramidal textured Si as an engineered surface to capture more light to maximize absorption in the CdTe/Si tandem design. The Energy dispersive X-ray (EDX) results showed that all the CdTe deposited on textured n-Si exhibited more Te atoms than Cd atoms, irrespective of the CdCl2 treatment. The presented results suggest that the texturization and CdCl2 treatment improved the morphology and grain boundary passivation of the sputtered CdTe. The adhesiveness of CdTe on the n-Si substrate was also significantly enhanced. Our findings further demonstrate that proper surface treatment of the Si substrate can greatly improve the quality of CdTe grown on Si by reducing the strain that occurs during the growth process. This study demonstrates a valuable method for enhancing the integration of CdTe with Si for two-junction tandem solar cell applications. © 2023 The Authors
Elsevier Ltd
24058440
English
Article
All Open Access; Gold Open Access
author Isah M.; Doroody C.; Rahman K.S.; Harif M.N.; Kiong T.S.; Zuhdi A.W.M.
spellingShingle Isah M.; Doroody C.; Rahman K.S.; Harif M.N.; Kiong T.S.; Zuhdi A.W.M.
Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
author_facet Isah M.; Doroody C.; Rahman K.S.; Harif M.N.; Kiong T.S.; Zuhdi A.W.M.
author_sort Isah M.; Doroody C.; Rahman K.S.; Harif M.N.; Kiong T.S.; Zuhdi A.W.M.
title Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
title_short Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
title_full Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
title_fullStr Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
title_full_unstemmed Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
title_sort Lattice mismatch alleviation in p-CdTe/n-Si heterostructure by surface engineering on Si substrate
publishDate 2023
container_title Heliyon
container_volume 9
container_issue 11
doi_str_mv 10.1016/j.heliyon.2023.e21536
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-85175331621&doi=10.1016%2fj.heliyon.2023.e21536&partnerID=40&md5=cb9848c1d8247ed5c1512cd93159e252
description The study used magnetron sputtering to investigate the growth of cadmium telluride (CdTe) thin films on surface treated n-type silicon (n-Si) substrates. The n-Si substrates were textured using potassium hydroxide (KOH) before the sputter deposition of CdTe. This was followed by cadmium chloride treatment to reduce the strain at the interface of CdTe and Si, which is caused by the incompatible lattice and thermal expansion mismatch (CTE). X-ray diffraction (XRD) analysis showed that the lowest FWHM and dislocation densities were obtained for CdCl2/CdTe/txt-nSi, which aligns with the scanning electron microscopy (SEM) results. In the SEM images, the interface bonding between the CdTe and Si surfaces was visible in the cross-sections, and the top-view images revealed sputtered CdTe thin films conforming to the patterns of pyramidal textured Si as an engineered surface to capture more light to maximize absorption in the CdTe/Si tandem design. The Energy dispersive X-ray (EDX) results showed that all the CdTe deposited on textured n-Si exhibited more Te atoms than Cd atoms, irrespective of the CdCl2 treatment. The presented results suggest that the texturization and CdCl2 treatment improved the morphology and grain boundary passivation of the sputtered CdTe. The adhesiveness of CdTe on the n-Si substrate was also significantly enhanced. Our findings further demonstrate that proper surface treatment of the Si substrate can greatly improve the quality of CdTe grown on Si by reducing the strain that occurs during the growth process. This study demonstrates a valuable method for enhancing the integration of CdTe with Si for two-junction tandem solar cell applications. © 2023 The Authors
publisher Elsevier Ltd
issn 24058440
language English
format Article
accesstype All Open Access; Gold Open Access
record_format scopus
collection Scopus
_version_ 1809677887030165504