PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG)
This paper presents an automated approach for the inspection of photovoltaic (PV) cells using electroluminescence (EL) imaging. Histogram of Gradient (HoG) features are extracted from EL images and then reduced using Principal Component Analysis (PCA). The reduced features are then classified using...
Published in: | IEEE Symposium on Wireless Technology and Applications, ISWTA |
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2023
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Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85174315103&doi=10.1109%2fISWTA58588.2023.10249747&partnerID=40&md5=3157db69cc85b3b41b868599d571e849 |
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2-s2.0-85174315103 Yani A.N.A.; Shariff K.K.M.; Othman Z.; Sulaiman S.I.; Zakaria N.A.Z.; Yassin A.I. PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) 2023 IEEE Symposium on Wireless Technology and Applications, ISWTA 2023-August 10.1109/ISWTA58588.2023.10249747 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85174315103&doi=10.1109%2fISWTA58588.2023.10249747&partnerID=40&md5=3157db69cc85b3b41b868599d571e849 This paper presents an automated approach for the inspection of photovoltaic (PV) cells using electroluminescence (EL) imaging. Histogram of Gradient (HoG) features are extracted from EL images and then reduced using Principal Component Analysis (PCA). The reduced features are then classified using a Support Vector Machine (SVM) with a linear kernel. The performance of the model is evaluated using a publicly available dataset of EL images. Results show that the proposed method is able to classify EL images of PV cells with an accuracy of 100% for PV cells of size 4 and 16. The evaluation of the model is faster and more efficient when PCA is used. The proposed method is a promising tool for automating the process of EL image inspection. © 2023 IEEE. IEEE Computer Society 23247843 English Conference paper |
author |
Yani A.N.A.; Shariff K.K.M.; Othman Z.; Sulaiman S.I.; Zakaria N.A.Z.; Yassin A.I. |
spellingShingle |
Yani A.N.A.; Shariff K.K.M.; Othman Z.; Sulaiman S.I.; Zakaria N.A.Z.; Yassin A.I. PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) |
author_facet |
Yani A.N.A.; Shariff K.K.M.; Othman Z.; Sulaiman S.I.; Zakaria N.A.Z.; Yassin A.I. |
author_sort |
Yani A.N.A.; Shariff K.K.M.; Othman Z.; Sulaiman S.I.; Zakaria N.A.Z.; Yassin A.I. |
title |
PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) |
title_short |
PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) |
title_full |
PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) |
title_fullStr |
PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) |
title_full_unstemmed |
PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) |
title_sort |
PV Cell Defects Classification in Electroluminescence Images using Gradient Histogram (HOG) |
publishDate |
2023 |
container_title |
IEEE Symposium on Wireless Technology and Applications, ISWTA |
container_volume |
2023-August |
container_issue |
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doi_str_mv |
10.1109/ISWTA58588.2023.10249747 |
url |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85174315103&doi=10.1109%2fISWTA58588.2023.10249747&partnerID=40&md5=3157db69cc85b3b41b868599d571e849 |
description |
This paper presents an automated approach for the inspection of photovoltaic (PV) cells using electroluminescence (EL) imaging. Histogram of Gradient (HoG) features are extracted from EL images and then reduced using Principal Component Analysis (PCA). The reduced features are then classified using a Support Vector Machine (SVM) with a linear kernel. The performance of the model is evaluated using a publicly available dataset of EL images. Results show that the proposed method is able to classify EL images of PV cells with an accuracy of 100% for PV cells of size 4 and 16. The evaluation of the model is faster and more efficient when PCA is used. The proposed method is a promising tool for automating the process of EL image inspection. © 2023 IEEE. |
publisher |
IEEE Computer Society |
issn |
23247843 |
language |
English |
format |
Conference paper |
accesstype |
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record_format |
scopus |
collection |
Scopus |
_version_ |
1812871797708685312 |