Optimal Multi Load Shedding for Voltage Security Control in Bulk Power System

The unexpected progressing demand in most power system in the world has led to voltage decay phenomenon. This leads the system to operate below the acceptable voltage limit. Under voltage load shedding (UVLS) has been acceptably recognized as the suitable remedial action to alleviate the voltage dec...

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Bibliographic Details
Published in:2022 IEEE International Conference on Power and Energy: Advancement in Power and Energy Systems towards Sustainable and Resilient Energy Supply, PECon 2022
Main Author: Abd Shukor S.F.; Musirin I.; Hamid Z.A.; Mansor M.H.; Sentilkumar A.V.; Abd Samat A.A.
Format: Conference paper
Language:English
Published: Institute of Electrical and Electronics Engineers Inc. 2022
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85146438824&doi=10.1109%2fPECon54459.2022.9988914&partnerID=40&md5=f7ec7cfe231e9dc17dd47e3565eafc71
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Summary:The unexpected progressing demand in most power system in the world has led to voltage decay phenomenon. This leads the system to operate below the acceptable voltage limit. Under voltage load shedding (UVLS) has been acceptably recognized as the suitable remedial action to alleviate the voltage decay, which consequently causes voltage insecurity condition. Nevertheless, UVLS is the last option. Thus, a robust optimization technique would be the pre-requisite to optimal location and sizing to ensure a reliable and effective approach; without having to victimize the prioritized areas. This paper presents an optimal UVLS using a newly develop optimization technique termed as Integrated Chaotic Clonal Jaya Evolutionary Programming (ICCJEP). This study addresses a pre-developed voltage stability index as the indicator to voltage security improvement, which needs to be minimized. Validation under several combinations of UVLS schemes on the IEEE 30- Bus RTS indicated that the optimal UVLS can improve voltage security in power system indicated by the reduction of FVSI value as the index. © 2022 IEEE.
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DOI:10.1109/PECon54459.2022.9988914