LAS: Web-based laboratory attendance system by integrating RFID-ARDUINO technology

Managing student's attendance during laboratories session is tedious due to the large number of students, and this problem is worsen if laboratories session is conducted in parallel due to the lack of resources and time. Hence, this paper is aimed to overcome this problem by using RFID-ARDUINO...

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Bibliographic Details
Published in:2014 2nd International Conference on Electrical, Electronics and System Engineering, ICEESE 2014
Main Author: Arbain N.; Nordin N.F.; Isa N.M.; Saaidin S.
Format: Conference paper
Language:English
Published: Institute of Electrical and Electronics Engineers Inc. 2014
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84988305253&doi=10.1109%2fICEESE.2014.7154601&partnerID=40&md5=1cf242715afcd1cf010175f61d0a38f6
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Summary:Managing student's attendance during laboratories session is tedious due to the large number of students, and this problem is worsen if laboratories session is conducted in parallel due to the lack of resources and time. Hence, this paper is aimed to overcome this problem by using RFID-ARDUINO approach in web-based laboratories attendance system. The propose system will assist the lab instructor to record and manage the student attendance automatically. In addition, the system also provides an evaluation section for lab instructor to key-in and manage the student's experiment marks. The system is divided into two parts, which are the web-based development and system integration with the RFID-ARDUINO technology. An Arduino Uno microcontroller board is use as the hardware platform. Meanwhile, the web design is developed in Adobe Dreamweaver and Adobe Fireworks and deploy in XAMPP application server. Visual Basic scripting is use to integrate between hardware and SQL database. Upon testing, Web-based Laboratory Attendance System (LAS) is successfully facilitated the students' attendance and laboratory management on evaluation of student performance for particular experiment. © 2014 IEEE.
ISSN:
DOI:10.1109/ICEESE.2014.7154601