Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method

Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method

Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the...

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Published in:AIP Conference Proceedings
Main Author: Abdullah M.A.R.; Mamat M.H.; Ismail A.S.; Malek M.F.; Alrokayan S.A.H.; Khan H.A.; Rusop M.
Format: Conference paper
Language:English
Published: American Institute of Physics Inc. 2016
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984578942&doi=10.1063%2f1.4948831&partnerID=40&md5=65042819b8fd18e0693a0c257def26aa
id 2-s2.0-84984578942
spelling 2-s2.0-84984578942
Abdullah M.A.R.; Mamat M.H.; Ismail A.S.; Malek M.F.; Alrokayan S.A.H.; Khan H.A.; Rusop M.
Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
2016
AIP Conference Proceedings
1733

10.1063/1.4948831
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984578942&doi=10.1063%2f1.4948831&partnerID=40&md5=65042819b8fd18e0693a0c257def26aa
Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the thin films was increased whenever annealing temperature was increase. NiO thin films morphology structure analysis was confirmed by field emission scanning electron microscope. Surface roughness of the thin films was investigated by atomic force microscopy. © 2016 Author(s).
American Institute of Physics Inc.
0094243X
English
Conference paper
author Abdullah M.A.R.; Mamat M.H.; Ismail A.S.; Malek M.F.; Alrokayan S.A.H.; Khan H.A.; Rusop M.
spellingShingle Abdullah M.A.R.; Mamat M.H.; Ismail A.S.; Malek M.F.; Alrokayan S.A.H.; Khan H.A.; Rusop M.
Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
author_facet Abdullah M.A.R.; Mamat M.H.; Ismail A.S.; Malek M.F.; Alrokayan S.A.H.; Khan H.A.; Rusop M.
author_sort Abdullah M.A.R.; Mamat M.H.; Ismail A.S.; Malek M.F.; Alrokayan S.A.H.; Khan H.A.; Rusop M.
title Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
title_short Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
title_full Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
title_fullStr Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
title_full_unstemmed Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
title_sort Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method
publishDate 2016
container_title AIP Conference Proceedings
container_volume 1733
container_issue
doi_str_mv 10.1063/1.4948831
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984578942&doi=10.1063%2f1.4948831&partnerID=40&md5=65042819b8fd18e0693a0c257def26aa
description Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the thin films was increased whenever annealing temperature was increase. NiO thin films morphology structure analysis was confirmed by field emission scanning electron microscope. Surface roughness of the thin films was investigated by atomic force microscopy. © 2016 Author(s).
publisher American Institute of Physics Inc.
issn 0094243X
language English
format Conference paper
accesstype
record_format scopus
collection Scopus
_version_ 1809677606975438848

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