Preparation of nickel oxide thin films at different annealing temperature by sol-gel spin coating method

Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the...

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Bibliographic Details
Published in:AIP Conference Proceedings
Main Author: Abdullah M.A.R.; Mamat M.H.; Ismail A.S.; Malek M.F.; Alrokayan S.A.H.; Khan H.A.; Rusop M.
Format: Conference paper
Language:English
Published: American Institute of Physics Inc. 2016
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984578942&doi=10.1063%2f1.4948831&partnerID=40&md5=65042819b8fd18e0693a0c257def26aa
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Summary:Preparation of NiO thin films at different annealing temperature by sol-gel method was conducted to synthesize the quality of the surface thin films. The effects of annealing temperature on the surface topology were systematically investigated. Our studies confirmed that the surface roughness of the thin films was increased whenever annealing temperature was increase. NiO thin films morphology structure analysis was confirmed by field emission scanning electron microscope. Surface roughness of the thin films was investigated by atomic force microscopy. © 2016 Author(s).
ISSN:0094243X
DOI:10.1063/1.4948831