Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays

Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays

Undoped and Sn-doped Zinc oxide (ZnO) nanostructures have been fabricated using a simple sol-gel immersion method at 95°C of growth temperature. Thermal sourced by hot plate stirrer was supplied to the solution during ageing process of nanorods growth. The results showed significant decrement in the...

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Published in:AIP Conference Proceedings
Main Author: Ismail A.S.; Mamat M.H.; Malek M.F.; Abdullah M.A.R.; Sin M.D.; Rusop M.
Format: Conference paper
Language:English
Published: American Institute of Physics Inc. 2016
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984569842&doi=10.1063%2f1.4948827&partnerID=40&md5=84d07e32f2a0344bf59514ae4c2712fb
id 2-s2.0-84984569842
spelling 2-s2.0-84984569842
Ismail A.S.; Mamat M.H.; Malek M.F.; Abdullah M.A.R.; Sin M.D.; Rusop M.
Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
2016
AIP Conference Proceedings
1733

10.1063/1.4948827
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984569842&doi=10.1063%2f1.4948827&partnerID=40&md5=84d07e32f2a0344bf59514ae4c2712fb
Undoped and Sn-doped Zinc oxide (ZnO) nanostructures have been fabricated using a simple sol-gel immersion method at 95°C of growth temperature. Thermal sourced by hot plate stirrer was supplied to the solution during ageing process of nanorods growth. The results showed significant decrement in the quality of layer produced after the immersion process where the conductivity and porosity of the samples reduced significantly due to the thermal appliance. The structural properties of the samples have been characterized using field emission scanning electron microscopy (FESEM) electrical properties has been characterized using current voltage (I-V) measurement. © 2016 Author(s).
American Institute of Physics Inc.
0094243X
English
Conference paper
author Ismail A.S.; Mamat M.H.; Malek M.F.; Abdullah M.A.R.; Sin M.D.; Rusop M.
spellingShingle Ismail A.S.; Mamat M.H.; Malek M.F.; Abdullah M.A.R.; Sin M.D.; Rusop M.
Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
author_facet Ismail A.S.; Mamat M.H.; Malek M.F.; Abdullah M.A.R.; Sin M.D.; Rusop M.
author_sort Ismail A.S.; Mamat M.H.; Malek M.F.; Abdullah M.A.R.; Sin M.D.; Rusop M.
title Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
title_short Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
title_full Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
title_fullStr Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
title_full_unstemmed Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
title_sort Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays
publishDate 2016
container_title AIP Conference Proceedings
container_volume 1733
container_issue
doi_str_mv 10.1063/1.4948827
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984569842&doi=10.1063%2f1.4948827&partnerID=40&md5=84d07e32f2a0344bf59514ae4c2712fb
description Undoped and Sn-doped Zinc oxide (ZnO) nanostructures have been fabricated using a simple sol-gel immersion method at 95°C of growth temperature. Thermal sourced by hot plate stirrer was supplied to the solution during ageing process of nanorods growth. The results showed significant decrement in the quality of layer produced after the immersion process where the conductivity and porosity of the samples reduced significantly due to the thermal appliance. The structural properties of the samples have been characterized using field emission scanning electron microscopy (FESEM) electrical properties has been characterized using current voltage (I-V) measurement. © 2016 Author(s).
publisher American Institute of Physics Inc.
issn 0094243X
language English
format Conference paper
accesstype
record_format scopus
collection Scopus
_version_ 1809677607431569408

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