Investigation of stress and electrical properties of air-annealed and oxygen-annealed aluminium-doped zinc oxide nanorod arrays

• Published in: Advanced Materials Research
• Main Author: Mamat M.H.; Md Sin N.D.; Saurdi I.; Hafizah N.N.; Malek M.F.; Asiah M.N.; Khusaimi Z.; Habibah Z.; Nafarizal N.; Rusop M.
• Format: Conference paper
• Language: English
• Published: 2014
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84891589157&doi=10.4028%2fwww.scientific.net%2fAMR.832.303&partnerID=40&md5=16480aef54bce3bbad7f33b38a3665b0

In this research, we prepared aluminium (Al)-doped ZnO nanorod arrays on the glass substrate using sonicated sol-gel method. These nanorod arrays were annealed at 500 °C in air and oxygen environment using thermal furnace. Field emission scanning electron microscopy (FESEM) image reveals that nanorod arrays were deposited vertically aligned on the substrate. The stress characteristics of air-annealed and oxygen-annealed Al-doped ZnO nanorod arrays were investigated using Raman spectroscopy and X-ray diffraction (XRD) measurement. The electrical properties of the samples were investigated using two-probe current-voltage (I-V) measurement system. The results show that annealing atmospheres greatly influenced the stress and electrical properties of the nanorod arrays. © (2014) Trans Tech Publications, Switzerland.