| 总结: | In this research, we prepared aluminium (Al)-doped ZnO nanorod arrays on the glass substrate using sonicated sol-gel method. These nanorod arrays were annealed at 500 °C in air and oxygen environment using thermal furnace. Field emission scanning electron microscopy (FESEM) image reveals that nanorod arrays were deposited vertically aligned on the substrate. The stress characteristics of air-annealed and oxygen-annealed Al-doped ZnO nanorod arrays were investigated using Raman spectroscopy and X-ray diffraction (XRD) measurement. The electrical properties of the samples were investigated using two-probe current-voltage (I-V) measurement system. The results show that annealing atmospheres greatly influenced the stress and electrical properties of the nanorod arrays. © (2014) Trans Tech Publications, Switzerland.
|
|---|