| Summary: | Multilayer ZnO/MgO was successfully deposited using sol-gel spin coating method at different MgO molar concentration. The electrical and dielectric properties of deposited multilayer films were investigated using two point probes I-V measurement and impedance spectroscopy respectively. The resistivity was calculated based on I-V curve obtained and the results show that there is increment in resistivity values from 1.04 x 105Ω.cm to 7.45 x 105Ω.cm as the MgO concentration varied from 0.2M to 1.0M. The growth of multilayer films was measured in term of their thickness using surface profiler. Moreover from the observation, the value of dielectric constant, k is decrease when the MgO concentrations increase due to non-uniform and porous structure in the films. This is proven by their surface morphology observed by field emission scanning electron microscopy, FESEM. There is also interesting view obtained in this work where the surface morphology of multilayer film with 0.2M and 0.4M MgO concentration produced nanoflower and nano-rod like structure respectively. © (2012) Trans Tech Publications, Switzerland.
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