Factor-space dimension reduction for sensitivity analysis of intelligent electronic devices
Implementation of uncertainty and sensitivity analysis for testing measurement accuracy of a commercial Intelligent Electronic Device (IED) requires unaffordable number of an IED tests. The main reason is a large number of factors (i.e. high dimension of factor space) that potentially affects the ac...
| Published in: | IEEE Region 10 Annual International Conference, Proceedings/TENCON |
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| Main Author: | |
| Format: | Conference paper |
| Language: | English |
| Published: |
2011
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84856869474&doi=10.1109%2fTENCON.2011.6129268&partnerID=40&md5=b96fbf5d8636b883f2b06587e27bc05f |