Photoresponse characteristics of nanostructured aluminum doped Zinc oxide thin films
Aluminium doped Zinc oxide (ZnO) thin films were prepared through sol gel dip coating technique with various doping concentrations from 0 to 1.5 at.%. The thin films were characterized using X-ray Diffractometer (XRD), Field Emission Scanning Electron Microscope (FESEM), UV-Vis-NIR spectrophotometer...
出版年: | International Conference on Electronic Devices, Systems, and Applications |
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第一著者: | |
フォーマット: | Conference paper |
言語: | English |
出版事項: |
2011
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オンライン・アクセス: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-80055069501&doi=10.1109%2fICEDSA.2011.5959097&partnerID=40&md5=11e89d0947603606ea25e014ff833d84 |