Impact of CT saturation on phasor measurement algorithms: Uncertainty and sensitivity study
An important element of any Intelligent Electronic Device (IED) is the phasor measurement algorithm. The role of such algorithm is to extract fundamental frequency phasors from signals measured on secondary winding of a current transformer (CT). As a result of faults and switching in primary network...
出版年: | 2010 IEEE 11th International Conference on Probabilistic Methods Applied to Power Systems, PMAPS 2010 |
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第一著者: | |
フォーマット: | Conference paper |
言語: | English |
出版事項: |
2010
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オンライン・アクセス: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-77956435712&doi=10.1109%2fPMAPS.2010.5528400&partnerID=40&md5=c51333ccee66dbc19f802fd7c273649e |